Cartesian geometry energy dispersive X-ray fluorescence spectrometer

Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards.

Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. Monochromatic or polarized excitation from secondary targets, instead of conventional “noisy” white radiation (Bremsstrahlung) direct excitation, vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, affords a spectrometer capable of routine trace element analysis even in difficult sample types. Up to five secondary targets cover the complete elemental range (Na – U) with optimized ...


  • Analyze from sodium (₁₁Na) through uranium (₉₂U)
  • Non-destructive elemental analysis
  • Quantify solids, slurries, liquids, powders and coatings
  • Polarized excitation delivers lower detection limits
  • High resolution silicon drift detector (SDD)
  • Analysis in air, helium or vacuum
  • RPF-SQX for semi-quantitative analysis without standards
  • Semi-empirical calibrations require very few standards
  • Advanced novel treatment of peak overlap reduces errors
  • EZ Analysis interface for routine operation
  • Standard 15-position automatic sampler

Item Name
X-ray fluorescence (XRF)_UoN
Item Category
Facilities and Equipment
Item Image